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Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology
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Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology
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Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology
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![Transistors With Electrically Active Chip Seal Ring And Methods Of Manufacture SHIBIB; M. Ayman ; et al. [Siliconix Incorporated]](https://uspto.report/patent/app/20200357755/US20200357755A1-20201112-D00000.png "Transistors With Electrically Active Chip Seal Ring And Methods Of Manufacture SHIBIB; M. Ayman ; et al. [Siliconix Incorporated]")
Transistors With Electrically Active Chip Seal Ring And Methods Of Manufacture SHIBIB; M. Ayman ; et al. [Siliconix Incorporated]
Figure 2 from Reliability of segmented edge seal ring for RF devices | Semantic Scholar
